Obtain high-resolution images of selected areas to identify the causes of failure
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Scanning electron microscopy, also known as SEM analysis, is the main technique used to investigate the causes of failure in failure analysis and allows morphological investigations of surfaces to be carried out with magnifications of up to 400,000x. Thanks to these images, it is possible to analyse, for example, ductile and brittle fracture zones, beach lines, contaminants, hydrogen embrittlement and corrosion.
Tests are necessary to fine-tune innovative solutions for products and components across various application sectors.
Metallic Materials
Advanced Materials
Automotive
Aerospace
Industrial
Electronics
We perform a variety of scanning electron microscopy tests, both standardised and customised, to obtain high-resolution images and identify the causes of failure.
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All analyses can be structured in a completely customised manner, based on customer requirements. We offer tailor-made tests for materials, conditions of use and required regulations, ensuring reliable and targeted results.
For further insights, articles, and regulations on material corrosion, visit the CORROSIONPEDIA portal (https://www.corrosionpedia.com)
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The SEM electron microscope enables high-resolution analysis of surfaces and microstructures, supporting sectors such as electronics, aerospace and cultural heritage in research and quality control.
All tests can be performed in a completely customized manner, adapting to the customer's needs. Pontlab also offers tailored consulting services to define the most suitable tests, ensuring reliable and targeted results.
In addition to scanning microscopy tests, Pontlab performs countless other tests, including on different materials such as polymers, fabrics, leather and paints. Discover the other tests by visiting the dedicated pages.